Article ID Journal Published Year Pages File Type
1430420 Materials Science and Engineering: C 2007 4 Pages PDF
Abstract

The structural evolution of cobalt nanoclusters synthesized in silica glass by ion implantation has been investigated upon thermal annealing. The samples were characterized by in-situ grazing incidence X-ray diffraction, exploiting a synchrotron radiation beam and following their evolution during thermal treatments in vacuo up to T = 800 °C. Before heating, the system is composed of hcp Co nanocrystals; we have not detected the transition from hcp to fcc structure that in the bulk phase occurs around 420 °C; nevertheless, the differences in the diffraction pattern recorded at T = 800 °C with respect to the corresponding one at room temperature suggest the presence of a second crystalline phase.

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