Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1430420 | Materials Science and Engineering: C | 2007 | 4 Pages |
Abstract
The structural evolution of cobalt nanoclusters synthesized in silica glass by ion implantation has been investigated upon thermal annealing. The samples were characterized by in-situ grazing incidence X-ray diffraction, exploiting a synchrotron radiation beam and following their evolution during thermal treatments in vacuo up to T = 800 °C. Before heating, the system is composed of hcp Co nanocrystals; we have not detected the transition from hcp to fcc structure that in the bulk phase occurs around 420 °C; nevertheless, the differences in the diffraction pattern recorded at T = 800 °C with respect to the corresponding one at room temperature suggest the presence of a second crystalline phase.
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Authors
C. Maurizio, G. Mattei, P. Canton, E. Cattaruzza, C. de Julián Fernández, P. Mazzoldi, F. D'Acapito, G. Battaglin, C. Scian, A. Vomiero,