Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1430570 | Materials Science and Engineering: C | 2008 | 4 Pages |
Abstract
We report a widely applicable and highly controlled approach, based on electron beam lithography (EBL), to interconnect single nano-objects, previously immobilized onto solid surfaces, and to investigate the transport properties at the level of single nanostructures. In particular, a three-step EBL-procedure was used for this purpose by patterning two planar contacts on the sides of an individual nano-object. To demonstrate this approach, we use two different kinds of active elements: a semiconductor nanocrystal (tetrapod) and a thin triangular gold nanoprism (NT).
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Authors
A. Della Torre, P.P. Pompa, L.L. del Mercato, R. Chiuri, R. Krahne, G. Maruccio, L. Carbone, L. Manna, R. Cingolani, R. Rinaldi, S. Shiv Shankar, M. Sastry,