Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1443661 | Synthetic Metals | 2006 | 11 Pages |
Abstract
Based on a new model for thin-film field-effect transistors, in which the active layer is treated as purely two-dimensional, the effects of impurities on the electrical characteristics are discussed. Localized electronic levels are introduced into the model. It is shown that the presence of traps readily accounts for the non-linearities in the current-voltage curves. Trap states can also explain the temperature dependence of the current and mobility, including the so-called Meyer-Neldel Rule. Finally, transients are qualitatively discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Biomaterials
Authors
P. Stallinga, H.L. Gomes,