| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1446150 | Acta Materialia | 2013 | 8 Pages |
Abstract
The atomic structure of the silicon Σ13(5 0 1) symmetric tilt grain boundary interface has been determined using Bragg rod X-ray scattering. In contrast to conventional structural studies of grain boundary structure using transmission electron microscopy, this approach allows the non-destructive measurement of macroscopic samples. The interface was found to have a single structure that is fully fourfold coordinated. X-ray diffraction data were measured at Beamline I07 at the Diamond Light Source.
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Physical Sciences and Engineering
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Authors
P.B. Howes, S. Rhead, M. Roy, C.L. Nicklin, J.L. Rawle, C.A. Norris,