| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1446708 | Acta Materialia | 2012 | 8 Pages |
Abstract
Grain boundaries in thin Bi(1 1 0) films deposited on highly oriented pyrolytic graphite are investigated at atomic resolution using scanning tunnelling microscopy and high-resolution transmission electron microscopy. We find preferred misorientation angles Θ equal to 216°, 87°, 49°, 31°, 20°, 12° and 5°, the majority of which can be classified as large-angle boundaries. We find good agreement between the experimental results and a model of the tilt [1 1 0] grain boundary developed here. A method for estimating the surface unit cell based on measurement of dihedral angle in low-resolution images is also developed.
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Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
P.J. Kowalczyk, D. Belić, O. Mahapatra, S.A. Brown,