| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1448947 | Acta Materialia | 2010 | 4 Pages |
Abstract
This article reports the first investigations of CuIn1−xGaxSe2 (CIGSe) polycrystalline thin films by means of atom probe tomography. Attention is focused on the distribution of Na atoms within the films. Both Na-containing and Na-free CIGSe thin films have been investigated. When Na is available during the CIGSe coevaporation, it is observed to be mainly segregated at the grain boundaries of the films; however, it is also detected within the grains of CIGSe at very low concentration.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
E. Cadel, N. Barreau, J. Kessler, P. Pareige,