Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1449958 | Acta Materialia | 2007 | 10 Pages |
Three-dimensional simulations of grain growth in thin films containing finely dispersed second-phase particles were performed using a phase field model. The simulations show that although the growth behavior of the columnar grain structures in thin films is essentially two-dimensional, the interaction between the particles and the grain boundaries is three-dimensional. Grain boundaries can therefore more easily break free from the particles than in purely two-dimensional systems, resulting in fewer grain boundary–particle intersections and a larger final grain size. For a given volume fraction fV and size of the particles r , the final grain size R¯lim increases with film thickness. Moreover, it was found that particles located in the middle of the film are most efficient in pinning grain boundaries. A classical Zener type relation R¯lim/r=K(1/fVb) cannot describe these effects.