Structural characterization and electrochemical properties of cerium–vanadium (Ce–V) mixed oxide films synthesized by chemical route

Mixed oxide thin films of cerium and vanadium were obtained by chemical bath method from Ce(NO3)3 and 6H2O, NH4VO3 with distilled water as solvent in the presence of polyethylene glycol (PEG) as surfactant and dip coated on non-conducting quartz substrate. The optical, structural and morphological properties depend on post-deposition temperature. No remarkable effect was observed upon the addition of surfactant. The amorphous to polycrystalline transition of the films revealed that the inclusion of CeO2 was responsible for the widening of the energy bandgap 3.8 eV. The supercapacitive behavior of the electrode was evaluated using cyclic voltammetry (CV) and galvanostatic charge discharge techniques in 1 M LiClO4. The specific capacitance of 179 F/g was achieved for the mixed oxide electrode at a scan rate of 20 mV/s.