Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1460228 | Ceramics International | 2015 | 6 Pages |
Abstract
The influence of sintering temperature on the microwave dielectric properties and microstructure of the (1−y)Zn2SnO4–yCa0.8Sr0.2TiO3 ceramic system were investigated with a view to their application in microwave devices. A (1−y)Zn2SnO4–yCa0.8Sr0.2TiO3 ceramic system was prepared by the conventional solid-state method. The X-ray diffraction patterns of the 0.85Zn2SnO4–0.15Ca0.8Sr0.2TiO3 ceramic system did not significantly vary with sintering temperature. A dielectric constant of 9.6, a quality factor (Q×f) of 15,900 GHz, and a temperature coefficient of resonant frequency of −4 ppm/°C were obtained when the 0.85Zn2SnO4–0.15Ca0.8Sr0.2TiO3 ceramic system was sintered at 1175 °C for 4 h.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Yih-Chien Chen, Hong-Mine You,