Influences of Ag nanoparticles on the microstructure and texture of CeO2 films prepared by chemical solution deposition

CeO2 films with Ag nanoparticles (AgNPs) were prepared on Ni–5 at%W (NiW) substrates by chemical solution deposition. The effects of AgNPs on the texture and microstructure of the CeO2 films were investigated. The phase formation, texture and surface morphology of CeO2+x%Ag films were characterized by X-ray diffraction and atomic force microscopy. AgNPs were considered to be useful to the texture evolution and smooth surface of crystallized films. With the addition of AgNPs, the full-width at half maximum (FWHM) values of omega and phi scans decreased. AgNPs in CeO2 matrix (x=0.1) could improve the texture of film during the crystallization. The results indicate that the CeO2+AgNPs film can be a candidate buffer layer of coated conductors.