Effects of annealing on dielectric and ferroelectric properties in Pb(In1/2Nb1/2)O3–xPbTiO3(x≤0.30) ceramics

(1−x)Pb(In1/2Nb1/2)O3–xPbTiO3 (PIN–xPT, x=0.05, 0.10, 0.15, 0.20, 0.25 and 0.30) ceramics were prepared by wolframite method and then annealed at 650 °C for 24 h. Effects of PT contents on the phase structure in these ceramics were analyzed by XRD. The samples with x≥0.15 were of single phase perovskite structure. The stability of perovskite phase structure for the samples with x≤0.10 was improved by using thermal annealing. Dielectric and ferroelectric properties of these samples were systematically investigated. It was found that the dielectric constants of the PIN–PT ceramics were increased within a wide temperature range and the phase transition temperatures shifted to low temperature after annealing. Hysteresis loops in PIN–xPT(x<0.20) ceramics had fake polarization and the peaks of electrical current appeared at the maximum applied field. The effects of PT content and annealing on dielectric and ferroelectric properties in PIN–PT ceramics are discussed.