Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1460937 | Ceramics International | 2015 | 4 Pages |
Abstract
Lead-free (Na0.5Bi0.5)0.95Ba0.05TiO3 (0.95NBT–0.05BT) thin films were deposited on polycrystalline Ni substrates by using the RF high-pressure sputtering system. Microstructural studies by high resolution X-ray diffraction reveal that the as-deposited 0.95NBT–0.05BT thin films are polycrystalline structures. The piezoelectric property measurements by a piezoresponse force microscopy exhibit that the polycrystalline 0.95NBT–0.05BT thin films have an excellent piezoelectric response. It is indicated that the as-grown 0.95NBT–0.05BT thin films have the potential for the development of the structural health monitoring systems and related device applications.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Sheng Cheng, Ming Liu, Jiangbo Lu, Lu Lu, Linglong Li, Yaodong Yang,