| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1461919 | Ceramics International | 2012 | 7 Pages |
Abstract
This study elucidates the microwave dielectric properties and microstructures of Nd(Mg0.5−xZnxSn0.5)O3 ceramics for their potential applications in microwave devices. The Nd(Mg0.5−xZnxSn0.5)O3 ceramics were prepared by the conventional solid-state method with various sintering temperatures. X-ray diffraction (XRD) patterns of the Nd(Mg0.4Zn0.1Sn0.5)O3 ceramics revealed only a slight variation of phase with sintering temperatures. Additionally, a dielectric constant (εr)(εr) of 19.5, a quality factor (Q × f) of 129,200 GHz, and a temperature coefficient of resonant frequency (τf)(τf) of −66 ppm/°C were obtained for Nd(Mg0.4Zn0.1Sn0.5)O3 ceramics sintered at 1500 °C for 4 h.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Yih-Chien Chen, Kuang-Chiung Chang, Shi-Li Yao,