Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1462061 | Ceramics International | 2012 | 4 Pages |
Abstract
Barium strontium titanate, (BaxSr1−x)TiO3 (BST) thin films have been prepared on alumina substrate by sol–gel technique. The X-ray patterns analysis indicated that the thin films are perovskite and polycrystalline structure. The interdigital electrode with 140 nm thickness Au/Ti was fabricated on the film with the finger length of 80 μm, width of 10 μm and gaps of 5 μm. The temperature dependence of dielectric constant of the BST thin films in the range from −50 °C to 50 °C was measured at 1 MHz. The dielectric properties of the BST thin films were measured by HP 8510C vector network analyzer from 50 MHz to 20 GHz.
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Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Peng Qi, Ji-wei Zhai, Xi Yao,