Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1464360 | Ceramics International | 2008 | 4 Pages |
Abstract
With the miniaturization trend of modern electronic devices and increasing demand for multilayer ceramic chip components, a full understanding of the role of the co-fired ceramic/electrode interface in the performance and long-term reliability of the components becomes very important. In the present work, the inter-diffusion and structure of the co-fired interface of Pb-based relaxor ferroelectrics and Ag-Pd metal electrode were investigated by scanning electron microscopy (SEM) and transmission electron microscopy-energy dispersive analysis of X-rays (TEM-EDAX). No strong structural distortions were observed at the co-fired ceramic/electrode interface except for a thin interfacial layer of 1.5Â nm thick on each side of the interface. The ceramic near the interface retains the perovskite lattice structure. It is suggested that the diffused electrode compositions could be incorporated into the perovskite lattice.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Jiang Li Cao, Xiao Hui Wang, Zhi Lun Gui, Long Tu Li,