Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1465151 | Ceramics International | 2007 | 4 Pages |
Abstract
Differently doped Ge–Sb–Te phase-change recording films were prepared by the individual dc magnetron sputtering of Sn5Ge3Sb72Te20, In5Ge3Sb72Te20, Ga5Ge3Sb72Te20 and Bi5Ge3Sb72Te20 targets. A close relationship was observed between surface roughness and reflectivity. The Ge–Sb–Te films doped with Bi showed the highest surface roughness and reflectivity. The phase-change optical disks with Bi-doped Ge–Sb–Te recording films showed the best overwriting characteristics. Therefore, the reversible recording properties of the phase-change optical disk were dominated by the composition of the recording film.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Su-Shia Lin,