Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1465330 | Ceramics International | 2009 | 6 Pages |
Abstract
A TiO2 nanoceramic film was prepared as an alternative absorber layer for infrared thermal detectors. The TiO2 film was amorphous, and its grain size increased with the ion anode voltage and oxygen flow rate. Moiré deflectometry was applied for measuring the nonlinear refractive indices of TiO2 films on polycarbonate (PC) substrates. The nonlinear refraction index was measured to be of the order of 10−8 cm2 W−1 and the change in refractive index was of the order of 10−5. The linear refractive index was correlated with the porosity. Denser TiO2 films exhibited higher linear refractive indices, obvious red-shifts and narrower absorption bands in the near-IR region.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Su-Shia Lin, Shin-Chi Chen, Yuan-Hsun Hung,