Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1470749 | Corrosion Science | 2010 | 4 Pages |
Abstract
The anodic behaviour of sputtered microcrystalline Al (mc-Al) was investigated in neutral Na2SO4 electrolyte under varied conditions. Our results revealed that Cl− addition led to a reduction in the anodic current density, which we considered unusual. Mott–Schottky analysis showed that Cl− introduction altered the semiconducting property of the passive film from n-type to p-type, implying that the p-type film can possessed a relative higher stability. Immersion of mc-Al in other electrolytes yielded films with n-type, p-type and positive p–n junction structure. The results also indicate that the p-type film was most stable and the positive p–n junction film least stable.
Related Topics
Physical Sciences and Engineering
Materials Science
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Authors
Bo Zhang, Ying Li, Fuhui Wang,