Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1471001 | Corrosion Science | 2010 | 12 Pages |
Abstract
Thin copper-oxide layers formed on Cu-metal due to the exposure to ambient air at short and long timescales were investigated by means of reflection mode grazing incidence X-ray absorption spectroscopy under specular and non-specular conditions. The quantitative evaluation of near edge X-ray absorption, as well as specular and non-specular EXAFS data measured for various different grazing angles show that the oxide film is best described by a model structure consisting of a duplex type oxide layer with an outer layer of CuO in contact with the gas atmosphere and an inner Cu2O layer at the interface to the underlying Cu-metal.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
P. Keil, R. Frahm, D. Lützenkirchen-Hecht,