Article ID Journal Published Year Pages File Type
1474166 Journal of the European Ceramic Society 2013 4 Pages PDF
Abstract

The mechanical properties of ceramics films at the sub-micron, even nanometer length scale have attracted increased attention due to the high-speed development of microelectronic technology. In this work, nano-indentation hardness as a function of the different individual layer thickness has been measured and investigated in the sputtered Al/Si3N4 multilayers with different indenters (Vickers and Brinell). For this ceramics/metal multilayers system, the hardness of the multilayers increases with decreasing individual layer thickness from 500 nm to 100 nm and from 50 nm to 10 nm, indicating a significant size effect. At the same time, changes in the deformation behavior may be controlled by different deformation mechanisms for submicron scale and nanometer scale.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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