Article ID Journal Published Year Pages File Type
1475749 Journal of the European Ceramic Society 2009 6 Pages PDF
Abstract

The multiple light scattering in concentrated alumina suspensions adapted to stereolithography can be modeled using diffuse reflectance measurements coupled to the Kubelka–Munk model. The penetration depth of UV radiation can be related to the scattering coefficient allowing the prediction of the cure depth with an accuracy of 20%.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
, , , , ,