Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1475749 | Journal of the European Ceramic Society | 2009 | 6 Pages |
Abstract
The multiple light scattering in concentrated alumina suspensions adapted to stereolithography can be modeled using diffuse reflectance measurements coupled to the Kubelka–Munk model. The penetration depth of UV radiation can be related to the scattering coefficient allowing the prediction of the cure depth with an accuracy of 20%.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Y. Abouliatim, T. Chartier, P. Abelard, C. Chaput, C. Delage,