Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1476297 | Journal of the European Ceramic Society | 2011 | 6 Pages |
Abstract
We report about the dynamic behavior of a nanometer-scale amorphous intergranular film (IGF) in a Si3N4 ceramic by an in situ heating experiment in a high-resolution transmission electron microscopy (HRTEM). During the experiment the IGF gradually vanishes at 820 °C accompanied by the formation of crystal planes within the IGF. The IGF reappears after cooling back to room temperature. The results cannot be explained within the framework of a force balance model. We argue that the dynamic behavior of the IGF in our experiment originates from the open system observed.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Zaoli Zhang, Wilfried Sigle, Christoph T. Koch, Manfred Rühle,