Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1477382 | Journal of the European Ceramic Society | 2006 | 8 Pages |
Abstract
The present study was undertaken to establish a methodology for character rising silicon carbide-based refractories, as detailed information is unavailable in the literature on this point. We analysed several types of silicon carbide refractories belonging to the non-oxide and composite families of refractories, characterising each component by different methods. The phases were characterised first by X-ray diffraction (XRD). The components were then chemically characterised by different methods, which included the wet method, X-ray fluorescence (XRF) spectrometry, coulometry and inductively coupled plasma optical emission spectrometry (ICP-OES). The best method for characterising each component was determined. The proposed methodology was validated using reference materials.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
M.F. Gazulla, M.P. Gómez, M. Orduña, A. Barba,