Article ID Journal Published Year Pages File Type
1477382 Journal of the European Ceramic Society 2006 8 Pages PDF
Abstract
The present study was undertaken to establish a methodology for character rising silicon carbide-based refractories, as detailed information is unavailable in the literature on this point. We analysed several types of silicon carbide refractories belonging to the non-oxide and composite families of refractories, characterising each component by different methods. The phases were characterised first by X-ray diffraction (XRD). The components were then chemically characterised by different methods, which included the wet method, X-ray fluorescence (XRF) spectrometry, coulometry and inductively coupled plasma optical emission spectrometry (ICP-OES). The best method for characterising each component was determined. The proposed methodology was validated using reference materials.
Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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