| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1488227 | Materials Research Bulletin | 2014 | 5 Pages |
•The Ea value of oxygen vacancy confirms the double hysteresis loops of the thin film.•The Nyquist plots show a polydispersive nature of relaxation for oxygen vacancies.•The distribution of relaxation times for oxygen vacancies is temperature independent.
Bi0.85Pr0.15Fe0.9Co0.1O3 (BPFCO) thin films were deposited on Pt(1 1 1)/TiO2/SiO2/Si(1 0 0) substrates, with SrRuO3 as buffer layer, by radio frequency magnetron sputtering. Oxygen-vacancies-related dielectric relaxation and scaling behaviors of Bi0.85Pr0.15Fe0.9Co0.1O3 (BPFCO) thin films have been investigated by temperature-dependent impedance spectroscopy. It can be confirmed that it is the high density of oxygen vacancy that causes the occurrence of the double loop hysteresis. The physical nature of relaxation process corresponding to oxygen vacancies was also discussed.
Graphical abstractFigure optionsDownload full-size imageDownload as PowerPoint slide
