Article ID Journal Published Year Pages File Type
1490208 Materials Research Bulletin 2010 5 Pages PDF
Abstract

In the present paper, the nitrogen-doped ZnO thin films with variable doping levels were produced by using wet chemical process. These ZnO films were investigated by PL spectrum, Raman spectrum, optical reflection and XRD measurement. The XRD result showed that a new phase appeared in the heavy-doped ZnO films. In addition, the small shift of the Raman peak indicated that the stress existed in these ZnO films. This resulted in the disorder of the lattice of the ZnO film and the appearance of new ZnO phase.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
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