| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1494775 | Optical Materials | 2012 | 7 Pages |
Abstract
⺠We studied organometallic complexes in form of thin films. ⺠X-ray diffractometry revealed partly crystalline structure. ⺠Ellipsometry proved thickness decrease under heating. ⺠2D X-ray diffractograms were recorded and new crystalline arrangement found. ⺠Orientation of crystallographic planes depended on compounds chemical composition.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Jacek Niziol, Jean-Luc Fillaut, Maciek Sniechowski, Farida Khammar, Bouchta Sahraoui,