Extended transfer matrix modeling of an erbium-doped cavity with SiO2/TiO2 Bragg reflectors

Starting from the measured parameters of multilayer microcavities activated by Er3+ ion, we developed a comprehensive model based on extended (3 × 3) transfer matrix formalism including sources. The cavity, fabricated by rf-sputtering technique, was constituted by an Er3+-activated SiO2 active layer inserted between two six-pair SiO2/TiO2 distributed Bragg reflectors. Near infrared transmittance spectra evidence the presence of a stop-band from 1350 to 1850 nm and a cavity resonance centered at 1537 nm. Intensity enhancement and narrowing of the 4I13/2→4I15/24I13/2→4I15/2 emission band of Er3+ ion were observed, owing to the cavity effect. A cavity quality factor of 171 was achieved. All observations show excellent agreement with transfer matrix simulations, leading to improvements of the devices design operating in laser regime.