| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1496619 | Optical Materials | 2007 | 5 Pages |
Abstract
Chemical composition of the fabricated waveguiding layers was determined by scanning electron microscopy (SEM-EDAX). Optical properties of the waveguides were characterized by a standard dark mode spectroscopy at the wavelength of 671Â nm and by near field imaging in the spectral range from 1500 to 1640Â nm.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
FrantiÅ¡ek OndráÄek, Linda Salavcová, Martin MÃka, FrantiÅ¡ek Lahodný, Radan SlavÃk, Jarmila Å pirková, JiÅà Ätyroký,