Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1496686 | Optical Materials | 2007 | 4 Pages |
Abstract
Antimony germanium sulphide (Sb-Ge-S) amorphous thin films have been directly fabricated on both silica on silicon and commercial glass substrates by means of chemical vapour deposition. These Sb-Ge-S films have been characterized by micro-Raman, scanning electron microscopy and energy dispersive X-ray analysis techniques. The analysis results for these amorphous films indicate the composition of Sb-Ge-S can be varied by changing the deposition temperatures. The quality of these Sb-Ge-S amorphous thin films gives them high potential for the chalcogenide optical waveguide and device applications.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
C.C. Huang, K. Knight, D.W. Hewak,