| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1496862 | Optical Materials | 2007 | 7 Pages |
Abstract
The optical properties of lead zirconate titanate (PZT) thin films deposited on ZnO were studied by m-lines spectroscopy. In order to retrieve the refractive index and the thickness of both layers from the m-lines spectra, we develop a numerical algorithm for the case of a two-layer system and show its robustness in the presence of noise. The sensitivity of the algorithm of the two-layer model allows us to relate the observed changes in the PZT refractive index to the PZT structural change due to the ZnO interface of the PZT/ZnO optical waveguide.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
T. Schneider, D. Leduc, J. Cardin, C. Lupi, N. Barreau, H. Gundel,