Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1497014 | Optical Materials | 2008 | 5 Pages |
Abstract
It is shown that the mode data of field assisted ion exchange profiles in glass can be mapped onto one another when the refractive index profiles are shifted versions of each other, i.e. of the form n(x + s) where s is a shift distance. This allows the mode data of shallow guides to be compared with data of deeper guides. The mapping has utility in that the shallow guide may not support a sufficient number of modes in order for a refractive index profile reconstruction to be made.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
R. Oven,