| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1497311 | Optical Materials | 2008 | 6 Pages |
Abstract
Structural and optical properties of Ba0.8Sr0.2TiO3(BST) ferroelectric thin films, deposited by the pulsed laser ablation (PLD) technique on Si/SiO2/Ti/Pt, Si/SrRuO3 and Si substrates, were performed by X-ray diffraction, micro Raman, atomic force microscopy (AFM), and optical reflectometry measurements. Temperature dependences of the Raman spectrum, and room temperature refractive and extinction indices, and surface roughness were evaluated.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
I. Aulika, J. Pokorny, V. Zauls, K. Kundzins, M. Rutkis, J. Petzelt,