Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1497631 | Optical Materials | 2006 | 4 Pages |
Abstract
Low dose rare earth implanted GaN is characterized by high resolution transmission electron microscopy: Cr, Er, Yb and Eu implantation in the range 1013-1014Â at./cm2 is investigated. The typical defect structure consists of a damaged layer containing a high density of stacking faults. Various sizes of I1 stacking faults were observed and the occurrence of large I1 faults (up to 200Â nm) is correlated with a high threading dislocations density in some of the GaN layers.
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Authors
Florence Gloux, Pierre Ruterana,