| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1497875 | Progress in Solid State Chemistry | 2006 | 9 Pages |
Abstract
Electronic and geometric properties of chromium oxide nanowires deposited on self-assembled block copolymer templates are evaluated by means of synchrotron radiation based spectroscopic methods like X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). The geometric distribution of the nanowires is monitored with X-ray photoelectron emission microscopy (XPEEM) and atomic force microscopy (AFM). XAS and XPS of Cr 2p emissions for chromium oxide nanostructures determine an oxidation state different from the most common chromium oxides and additional satellite peaks are derived from localization effects induced by the nanostructuring.
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Authors
O. Seifarth, D. Schmeißer, R. Krenek, A. Sydorenko, M. Stamm,