| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1498186 | Scripta Materialia | 2015 | 4 Pages |
Abstract
The atomic structure of a 0.94-nm-thick T1 precipitate in an Al–Cu–Li–Mg–Ag alloy is investigated by combining aberration-corrected scanning transmission electron microscopy (STEM) and energy-dispersive X-ray spectroscopy (EDX). Ag segregates at the first layer of the T1 precipitate interface, revealing a significant compositional variation of Ag throughout the interface. Moreover, the T1 precipitate thickened from 0.94 nm with successive stacking of identical 0.94 nm thick layers.
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Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Sung Jin Kang, Tae-Hoon Kim, Cheol-Woong Yang, Je In Lee, Eun Soo Park, Tae Won Noh, Miyoung Kim,