Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1498234 | Scripta Materialia | 2014 | 4 Pages |
Abstract
X-ray tomography has provided a non-destructive means for microstructure characterization in three and four dimensions. A stochastic procedure to accurately reconstruct material microstructure from limited-angle X-ray tomographic projections is presented and its utility is demonstrated by reconstructing a variety of distinct heterogeneous materials and elucidating the information content of different projection data sets. A small number of projections (e.g. 20–40) are necessary for accurate reconstructions via the stochastic procedure, indicating its high efficiency in using limited structural information.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Hechao Li, Nikhilesh Chawla, Yang Jiao,