| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1498246 | Scripta Materialia | 2014 | 4 Pages |
Abstract
Rietveld refinement of powder X-ray diffractograms from nanocrystalline yttria-stabilized zirconia (2, 3.5, 5.5 and 8 mol.% YO1.5) shows two tetragonal lattices. Transmission electron microscopy on powder with 8 mol.% YO1.5 reveals two types of particles: tetragonal phase agglomerates of crystallites up to 28 nm experience lattice expansion and unagglomerated primary particles of 6 ± 2 nm undergo lattice contraction. Lattice contraction is due to surface curvature. Expansion is due to grain boundary free volume and point defects.
Keywords
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Mohan B. Ponnuchamy, Ashutosh S. Gandhi,