Article ID Journal Published Year Pages File Type
1498502 Scripta Materialia 2014 4 Pages PDF
Abstract

Aluminium-assisted crystallization is used to grow single-crystalline SixGe1−x film epitaxially on Si substrate at a relatively low temperature (350–450 °C). Investigation of the mechanism by which Al film causes epitaxial growth of SixGe1−x suggests a four-step growth process is involved. The composition of the SixGe1−x film can be controlled by the annealing conditions. This SixGe1−x film can be used as a buffer layer for the epitaxial growth of Ge on Si or as a virtual substrate for the fabrication of III–V devices.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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