| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1498754 | Scripta Materialia | 2013 | 4 Pages |
Abstract
The sink strength of Cu–Nb interfaces was investigated by measuring the steady-state vacancy concentration profile adjacent to Cu–Nb interfaces during 1.8 MeV Kr+ irradiation. Broadening of dilute nanoscale Au tracer layers in Cu quantified position-dependent values for radiation-enhanced diffusivity and, accordingly, vacancy concentration. The measured vacancy profile corresponds to results calculated from a steady-state kinetic rate equation that assumes perfect sink efficiency at the Cu–Nb interface, indicating that it behaves like an ideal sink for vacancies in Cu.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Shimin Mao, Shen Dillon, Robert S. Averback,