| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1498948 | Scripta Materialia | 2013 | 4 Pages |
Abstract
Twin boundary migration is usually observed during annealing or plastic deformation. We report on in situ observation of Kr ion irradiation-induced microstructure evolution in epitaxial nanotwinned Ag films with an average twin thickness of 70 nm. Kr ion irradiation-induced defect clusters are absorbed by coherent and incoherent twin boundaries. Frequent interactions between defect clusters and twin boundaries lead to continuous migration of twin boundaries. The potential mechanisms of twin boundary migration are discussed.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
K.Y. Yu, D. Bufford, F. Khatkhatay, H. Wang, M.A. Kirk, X. Zhang,