Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1498991 | Scripta Materialia | 2012 | 4 Pages |
Abstract
The cross-sectional microstructure on Ti2AlC oxidized for 1 h at 900 °C was investigated using focused ion beam/transmission electron microscopy. An Al-depleted intermediate layer formed between the oxide scale and the substrate that consisted of nonstoichiometric Ti2AlxC nanocrystallites. The oxide scale consisted of a TiO2-rich outer layer and an Al2O3-rich inner layer. Ti2AlC has been theoretically predicted to preserve its crystal structure down to a sub-stoichiometry of Ti2Al0.5C, and such a Ti2AlxC phase was observed in this study.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Bai Cui, Daniel Doni Jayaseelan, William Edward Lee,