Article ID Journal Published Year Pages File Type
1499137 Scripta Materialia 2012 4 Pages PDF
Abstract

In situ compression of a body-centered cubic single crystal Fe–3% Si pillar in transmission electron microscopy (TEM) by scanning TEM mode was performed to observe a single dislocation moving through the pillar in real time. The deformation is characterized by a series of pronounced pop-ins, which are accompanied by increases in stress. It is shown that these stress increases are caused by the change from an edge dislocation dominated process to a screw dislocation dominated process.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
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