Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1499360 | Scripta Materialia | 2012 | 4 Pages |
Abstract
The two main mechanisms that cause the broadening of X-ray diffraction profiles in polycrystalline materials, i.e. those due to finite grain size and local strain inhomogeneities, are usually considered independently. In this paper, we discuss the potential interrelationship between them and propose a phenomenological equation which links the dispersion of strain distribution to grain size via the width of distorted regions near grain boundaries and the lattice disorder therein. The developed approach is applied to characterize crystallization processes in Gd-doped ceria films.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
E. Zolotoyabko, J.L.M. Rupp, L.J. Gauckler,