Article ID Journal Published Year Pages File Type
1499587 Scripta Materialia 2011 4 Pages PDF
Abstract

The thermodynamics of structural phase transformations in thin films depends on the mechanical stress that can be released by plastic deformation. For thin films below a critical film thickness, plastic deformation is energetically unfavourable: thus, the system stays coherent and stress remains. For PdHc films less than 22 nm thick, a new situation emerges: while the interfaces between matrix and hydride precipitates remain coherent throughout the complete phase transition, misfit dislocations form between the hydride phase and the substrate.

► Stress evolving during phase transformation changes thermodynamic properties of thin films. ► We investigate stress relaxation mechanisms inPdHc thin films during hydrogen loading. ► Below 22 nm film thickness misfit dislocations emerge between hydride phase and substrate. ► Below 22 nm film thickness misfit dislocation loop formation around precipitates is not possible. ► This yields a new state of partial coherency in thin films.

Related Topics
Physical Sciences and Engineering Materials Science Ceramics and Composites
Authors
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