| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1499768 | Scripta Materialia | 2011 | 4 Pages |
Abstract
Atomic transport along triple junctions (TJs) and grain boundaries (GBs) has been measured by atom probe tomography in nanocrystalline Ni/Cu bilayers. Heat treatment was chosen in the kinetic C-B regime according to generalized Harrison categories for the hierarchy of volume, GB and TJ transport. Diffusion coefficients at 623 K were found to be 4.65 × 10−20 and 1.65 × 10−17 m2 s−1 for the GB and TJ, respectively. Thus, TJs represent a significantly faster diffusion route than GBs.
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Authors
M.R. Chellali, Z. Balogh, L. Zheng, G. Schmitz,