Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1500081 | Scripta Materialia | 2011 | 4 Pages |
We report the structural and optical properties of a-plane GaN film grown on r-plane sapphire substrate by plasma-assisted molecular beam epitaxy. High resolution X-ray diffraction was used to determine the out-of-plane and in-plane epitaxial relation of a-plane GaN to r-plane sapphire. Low-temperature photoluminescence emission was found to be dominated by basal stacking faults along with near-band emission. Raman spectroscopy shows that the a-GaN film is of reasonably good quality and compressively strained.
► Structural and optical study of a-plane GaN film grown on r-sapphire by PAMBE. ► HRXRD was used to determine the epitaxial relation of a-plane GaN with r-sapphire. ► The plane-view TEM reveals the formation of basal stacking faults in a-plane GaN. ► Low temperature PL emission was found to be dominated by basal stacking faults. ► Raman spectroscopy study shows that a-GaN film is compressively strained.