Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1500502 | Scripta Materialia | 2011 | 4 Pages |
AuCu thin films were dealloyed in concentrated HNO3 solution at temperatures of 5–35 °C. X-ray diffraction and scanning electron microscopy analysis showed that interior grain regions undergo partial Cu dissolution before being assimilated into a ligament/void network that was initiated at grain boundaries. The compressive stress generated by removal of the smaller Cu atom yielded an activation energy for ligament growth of 25.4 ± 2.37 kJ mol−1, which is less than half that reported for AgAu alloys.
Research highlights► AuCu films dealloyed in nitric acid. ► Ligament/void network initiated at grain boundaries. ► Interior grain regions undergo partial Cu dissolution before being assimilated into network. ► Compressive stress generated by removal of the smaller Cu atom.► Activation energy for ligament growth was 25.4 ± 2.37 kJ/mol−1, less than half that for AgAu alloys.