| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1500684 | Scripta Materialia | 2009 | 4 Pages |
Abstract
We have investigated the microstructure and the magnetic properties of Zn1−xCrxO thin films deposited on squartz glass substrates using radiofrequency magnetron sputtering. The structural investigations demonstrate that the ferromagnetism observed at room temperature is an intrinsic property of Cr–ZnO films, and does not originate from any secondary phase. The experimental results show that defects due to singly negatively charged Zn vacancies, together with Cr doping, plays an important role in the ferromagnetic origin of Zn1−xCrxO thin films.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
L.J. Zhuge, X.M. Wu, Z.F. Wu, X.M. Chen, Y.D. Meng,