| Article ID | Journal | Published Year | Pages | File Type |
|---|---|---|---|---|
| 1501029 | Scripta Materialia | 2010 | 4 Pages |
Abstract
Hexagonal barium ferrite films were deposited on Si (1 1 1) substrates by radio-frequency magnetron sputter deposition. The films exhibited strong c-axis perpendicular orientation benefiting from a Pt buffer layer. The results include measurements of crystallographic structure, magnetic domain structure, and magnetic and microwave properties for barium hexaferrite films with different thicknesses of Pt underlayers, revealing ferromagnetic resonance linewidths, ΔH = 400–600 Oe at 40–60 GHz. These results provide a viable pathway to realizing miniaturized microwave devices integrated with semiconductor device platforms.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
L. Zhang, X.D. Su, Y. Chen, Q.F. Li, V.G. Harris,