Article ID | Journal | Published Year | Pages | File Type |
---|---|---|---|---|
1501059 | Scripta Materialia | 2008 | 4 Pages |
Abstract
In situ scanning electron microscopy micro-tensile tests were conducted on freestanding LIGA nickel thin films of two thicknesses (70 and 270 μm). The deformation and fracture mechanisms were elucidated by in situ scanning electron microscopy imaging and ex situ fractographic analysis. Due to the film microstructural gradient, an apparent thickness effect on the film yield strengths was observed, which was then rationalized with a continuum micromechanics model.
Related Topics
Physical Sciences and Engineering
Materials Science
Ceramics and Composites
Authors
Y. Yang, N. Yao, W.O. Soboyejo, C. Tarquinio,